We address and solve a fidelity problem in Fourier-transform infrared nanospectroscopy (nano-FTIR). As the technique is increasingly adopted for characterizing composite materials and nanophotonic systems, the nanoscale nature of the measurements introduces new challenges: current hyperspectral image acquisition at high spatial resolution suffers from significant artifacts caused by thermal instabilities that affect tip/sample positioning, so for long acquisitions both the spatial and spectral fidelity become unreliable. To overcome this, we introduce a new nano-FTIR measurement methodology based on step-scan interferometry combined with image registration. We demonstrate that our approach delivers superior spatial fidelity for nano-FTIR experiments and enables the collection of larger, reliable datasets.
G. Németh, F. Borondics, Step-scan interferometry for high-fidelity hyperspectral nanoscopy, ACS Nano 11 xxxx−yyyy, (2026), DOI: xx.xxxx